The precise characterization of the non-isotropic physical properties of crystalline geomaterials requires a precise knowledge of the orientation of samples used to perform experimental studies.
The orientation of individual crystals can be obtained by Laue X-ray diffraction, a well-established technique that allows a precise determination of the orientation matrix of the crystal under investigation.
Our X-ray diffraction lab hosts a vertical Laue backscattering X-ray diffraction orientation system (by Photonic Science) that allows to determine the orientation of crystals down to sizes of the order of 200 microns.
Our system uses a white beam with an energy range between 5 and 50 keV. The beam is focused to 200 microns beam spot, a CCD detector with wide active area (155 x 105 mm2) and high resolution (2500 x 1650 pixels). The sample positioning system is a completely automated XYZ stage. The system has also a dedicated analysis software to refine crystal orientation. The system allows to refine orientations with a resolution better than 0.1 degrees and accuracy of 0.1 degrees (tested on standard materials).
